O 37: Rastersondentechniken III
Friday, March 28, 2003, 11:15–12:45, HSZ/02
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11:15 |
O 37.1 |
Small cantilevers and an array detector for atomic force microscopy — •Tilman Schäffer
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11:30 |
O 37.2 |
Dielectric Breakdown of SiO2 and its Effect on the Surface Morphology Studied by Conducting Atomic-Force Microscopy — •Sascha Kremmer, Sven Peißl, Christian Teichert, and Friedemar Kuchar
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11:45 |
O 37.3 |
3-Dimensionale Kraftfeldspektroskopie mit atomarer Auflösung auf NiO(001) — •Alexander Schwarz, S. M. Langkat, H. Hölscher und R. Wiesendanger
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12:00 |
O 37.4 |
Einfluß von Adsorbatfilmen und Substratoberflächen auf die "shear force" Distanzregelung. — •Stefan Hoppe, Georgios Ctistis, Jens Paggel und Paul Fumagalli
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12:15 |
O 37.5 |
Conductivity measurements with a double cantilever device — •A.-D. Müller, F. Müller, J. Mehner, Th. Gessner, and M. Hietschold
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12:30 |
O 37.6 |
Kelvin Probe Force Microscopy of Porphyrin Molecules on Metal Substrates — •Christian Loppacher, Ulrich Zerweck, Sebastian Teich, Stefan Grafström, and Lukas M. Eng
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