O 5: Rastersondentechniken I
Montag, 24. März 2003, 11:15–12:45, FOE/ORG
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11:15 |
O 5.1 |
Apertureless near-field scanning optical microscopy: depth of field and vertical resolution — •Markus Raschke and Christoph Lienau
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11:30 |
O 5.2 |
Dependency of Light Scattering on the Geometry of Planar Nanoparticles — •Manuel Gonçalves and Othmar Marti
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11:45 |
O 5.3 |
Tunnel magneto-resistance in spin-polarized scanning tunneling spectroscopy calculated within scattering theory — •Piotr Karaś, Jürgen Henk, and Patrick Bruno
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12:00 |
O 5.4 |
Design and test of an improved optical detection system for STM induced photon emission — •P. Schmidt, T. Jürgens, J. Kuntze, and R. Berndt
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12:15 |
O 5.5 |
Mechanische Modifikation nahfeldoptischer Apertursonden zur Verbesserung der optischen Auflösung — •Daniel Molenda, Christiane Höppener, Harald Fuchs und Andreas Naber
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12:30 |
O 5.6 |
Einfluss von tribologischen Eigenschaften auf die Positioniergenauigkeit — •W. Hild, G. Hungenbach, Y. Liu, A. Opitz, P. Jaschinsky, M. Scherge und J. A. Schaefer
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