Hannover 2003 – scientific programme

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A: Atomphysik

A 11: Postersitzung 1

A 11.1: Poster

Tuesday, March 25, 2003, 16:00–18:30, Poster

Extraction of highly charged ions at the Berlin EBIT — •Frances Allen, Christoph Biedermann, and Rainer Radtke — Max-Planck-Institut für Plasmaphysik, Bereich Plasmadiagnostik, EURATOM Association, D-10117 Berlin, Germany

Electron Beam Ion Traps (EBIT) are used for the selective production of highly charged ions (HCI) of low temperature. At the Berlin EBIT such HCIs have been extracted from the trap using a newly installed beamline. The extraction characteristics of the set-up and the analysis system are described. The ion beam composition is studied by time-of-flight ion mass spectrometry and compared with data from x-ray emission spectroscopy of the ion trap inventory. It is intended to direct the low energy, highly charged ion beam onto a gas target to investigate charge exchange processes.