München 2004 – scientific programme

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Q: Quantenoptik und Photonik

Q 40: Laserspektroskopie

Q 40.1: Talk

Thursday, March 25, 2004, 16:30–16:45, HS 204

New Trends in Apertureless Scanning Near-field Optical Microscopy — •Javad Farahani, Hans -Juergen Eisler, and Bert Hecht — Nano-Optics Group, Dept. of Physics, University of Basel, Klingelbergstr. 82 CH-4056 Basel, Switzerland

Over the last years to overcome the problems of aperture SNOM, different techniques for apertureless SNOM have been exploited. In this work, we demonstrate that using small metal structures on a dielectric tip, illuminated by laser can be, potentially used to increase spatial resolution of optical microscopy far beyond the diffraction limit. The set-up is based on a combination of contact-mode AFM and confocal microscope. Depending on the direction of polarization of the incoming beam, fluorescence can be either enhanced or quenched, which in both case the fluorophore is recognized with resolution higher than diffraction limit.