Regensburg 2004 – scientific programme

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DS: Dünne Schichten

DS 19: FV-internes Symposium „Dünne Schichten für die Photovoltaik I“

DS 19.2: Invited Talk

Thursday, March 11, 2004, 10:10–10:50, HS 32

Photoelectron spectroscopy of thin film solar cell interfaces — •Andreas Klein — Darmstadt University of Technology, Institute of Materials Science, Surface Science Division

Interfaces are of crucial importance in semiconductor devices. The properties of crystalline Si and III-V semiconductor interfaces are experimentally and theoretically intensively investigated and well understood. However, important interfaces in thin film solar cells include II-VI semiconductors like CdTe or CdS and related chalcopyrites (Cu(In,Ga)(S,Se)₂), transparent conducting oxides (ZnO, SnO₂, In₂O₃) and partly also with amorphous and organic materials. The resulting complexity of the interfaces, which is even increased by the variety of deposition and processing techniques used for manufacturing high efficiency thin film solar cells, is to date not completely resolved. In this talk the phenomena occuring at thin film solar cell interfaces and the use of integrated surface analysis and preparation systems, which are used in Darmstadt for their investigation, will be described. For interface analysis we mostly use photoelectron spectroscopy (XPS, UPS), since this technique allows to determine not only chemical and morhpological, but also the electronic properties of the interfaces.