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DS: Dünne Schichten
DS 22: Postersitzung
DS 22.28: Poster
Tuesday, March 9, 2004, 14:30–17:00, Poster B
Investigation of the local electron emission from current-carrying silver nanoparticle films by means of emission electron microscopy — •A. Gloskovskii, D.A. Valdaitsev, S.A. Nepijko, and G. Schönhense — Johannes Gutenberg-Universität Mainz, Institut für Physik, Staudingerweg 7, D-55099 Mainz
Emission electron microscopy is a very convenient tool for the investigation of emission properties of metal nanoparticle films during passage of tunnel current [1]. In these systems the electron emission arises in the non-linear region of the current-voltage characteristic of the conduction current and has a local character (stems from separate emission centers). Owing to the energy and angle distributions of emitted electrons, the emission center is visualised in an emission electron microscope in the form of an elongated spot. Its size and shape enable to make quantitative estimations of the value of the electric field strength in the vicinity of the emission center and the energy spread of emitted electrons. The upper limit of the electric field strength near the emission center is 1.5·106 V/cm that is not enough to initiate field emission. An energy distribution with a width of 0.3 eV confirms our assumption about a thermal mechanism of the electron emission.
[1] A. Gloskovskii, D.A. Valdaitsev, S.A. Nepijko, N.N. Sedov and G. Schönhense Appl. Phys. A (published online 23 September 2003)