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DS: Dünne Schichten
DS 22: Postersitzung
DS 22.35: Poster
Dienstag, 9. März 2004, 14:30–17:00, Poster B
Structure and interface characterisation of Exchange Bias FeMn-FeNi films — •Danica Solina1, Maciej-Oskar Liedke2, Ursula Tietze1, Jürgen Fassbender2, and Andreas Schreyer1 — 1Institute for Materials Research, Dept. WFN (Neutron-/Synchrotron Scattering), GKSS-Research Center, PO Box 1160, D-21494 Geesthacht, Germany — 2Fachbereich Physik, Universität Kaiserslautern, Erwin-Schrödinger-Straße 56, 67663 Kaiserslautern, Germany
X-ray and neutron scattering studies have been carried out on thermally evaporated FeMn-FeNi exchange bias systems before and after ion irradiation by helium ions. Helium ion dosages of 1014 - 1017 ions cm−2 have been used. The ion irradiation has shown to alter the exchange bias characteristics of the samples with dose and rate. X-ray diffraction measurements on the samples were made to assess the epitaxy of the layers to the substrate. In order to assess the effect of ion irradiation on these films, both neutron and x-ray reflectivity measurements were performed and the data modelled simultaneously. A final model was chosen that approximated both sets of data well. The reflectivity data suggest that the samples are prone to etching of the surface layer by the ions and that ion irradiation encourages interlayer mixing resulting in a smearing of the oscillations. Increased ion dosages result in a complete loss of exchange bias properties which is supported with loss in inter-layer definition by ion irradiation.