Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
DS: Dünne Schichten
DS 22: Postersitzung
DS 22.39: Poster
Dienstag, 9. März 2004, 14:30–17:00, Poster B
Growth and Thermal (In-)Stability of Mulitlayers and Nanowires on Facetted Alumina Templates — •Carsten Herweg1, Jörg Hoffmann2, and Herbert C. Freyhardt1,2 — 1Institut für Materialphysik, Universität Göttingen, Tammannstr. 1, D-37077 Göttingen — 2Zentrum für Funktionswerkstoffe ZFW gGmbH, Windausweg 2, D-37073 Göttingen
Annealing of α-Al2O3 (1010), (m-plane) at ∼2/3· Tm (Tm: melting temperature) in air results in the formation of a highly ordered facetted alumina surface. Investigation by Atomic Force Microscopy (AFM) and cross-section ransmissionelectronmicroscopy (TEM) reveal a periodicity of ∼300 nm at a hill-to-valley hight of ∼50 nm. In such a way prepared alumina surfaces were utilised as substrate for the deposition of multilayers and nanowires. Metallic multilayers consisting of two immiscible components are known to be transformable into a nanostructered system of non-statistically distributed nearly spherical particles in a surrounding matrix of the complementary component by an annealing process. The influence of the underlying substrate structure, i.e. local curvature, on the film growth and on the microstructural transformation during the heat treatment is analysed by means of XRD, AFM, TEM and electrical transport measurement. AFM analysis and MOKE of nanowires prepared by grazing incident sputter deposition show, dependent on deposited material either overgrowing of the facets or well-defined, separated wires with a width of ∼100–150 nm, whereas the length is limited only by the macroscopic substrate dimensions.