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DS: Dünne Schichten

DS 9: Dünnschichtanalytik II

DS 9.2: Vortrag

Montag, 8. März 2004, 15:30–15:45, HS 32

Diffraction patterns of modulated permutation twins — •Ulrich Gebhardt¹, P. Wochner¹, A. Vigliante², H.U. Habermeier³, and F. Razavi⁴ — ¹MPI f. Metallforschung, Heisenbergstr. 3, 70569 Stuttgart — ²Bruker AXS GmbH, Karlsruhe — ³MPI f. Festkörperforschung, Stuttgart — ⁴Brock University, St. Catherines, Ontario, Canada

We studied the structural properties of epitaxial, thin film and low-Sr-doped lanthanum-manganites, grown on a SrTiO₃(001) substrate, as function of thickness by means of X-ray diffraction. The observed structure of these thin film manganites differ from bulk materials because of the presence of strain due to the lattice mismatch between substrate and film. Dependent on film thickness and on the chosen Bragg-peak the observed intensity distribution resembles something between a periodically modulated or a twinned structure. By assuming a nearly periodic array of twin domains we found by statistical calculation a good agreement of the model with the measured data.