Regensburg 2004 – wissenschaftliches Programm

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DY: Dynamik und Statistische Physik

DY 25: Growth and Roughness

DY 25.1: Vortrag

Dienstag, 9. März 2004, 15:00–15:15, H3

Interfacial melting of ice - the influence of roughness on the melting process — •Simon Engemann¹, Harald Reichert¹, Helmut Dosch¹, and Jörg Bilgram² — ¹MPI für Metallforschung, Heisenbergstr. 3, D-70569 Stuttgart — ²Laboratorium für Festkörperphysik, ETH, CH-8093 Zürich

Using a high-energy X-ray transmission-reflection scheme, we have studied ice-SiO₂ model interfaces. We observed the formation of a premelting quasiliquid layer and determined its thickness and density as a function of temperature. The influence of surface roughness was investigated by using SiO₂ substrates with different morphology. While the overall picture does not change with the roughness, the details as the layer thickness are modified. We discuss the implications for the understanding of the water structure.