Regensburg 2004 – scientific programme

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HL: Halbleiterphysik

HL 15: Photonische Kristalle III

HL 15.9: Talk

Tuesday, March 9, 2004, 12:15–12:30, H17

Near-field Microscopy of Photonic Crystals — •Ben Buchler, Patrick Kramper, Wolfgang Stumpf, Femius Koenderink, and Vahid Sandoghdar — Laboratory of Physical Chemistry, ETH Zurich, Switzerland

Using scanning near-field optical microscopy (SNOM), we have imaged the propagation of light in 2D photonic crystal defects. The samples are made from macroporous silicon with a bandgap ranging from 3.3 to 5.4µ m. We show that applying SNOM to the surface of the crystal allows measurement of the spatial mode of a resonant point defect microcavity [1]. The intensity pattern obtained can be explained by small (<10%) variations in the holes surrounding the resonator. Further SNOM measurements have been made of the light exiting a photonic crystal waveguide into free space [2]. Correct termination of the crystal facet is shown to produce highly directional emission. The effect can be explained via surface modes on the end facet of the crystal. Recent results from the near-field imaging of samples with a bandgap in the near-infrared will also be discussed.

[1] Kramper et al. Accepted to Opt. Lett. (2003)

[2] Kramper et al. Submitted (2003)