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HL: Halbleiterphysik

HL 23: Organische Halbleiter

HL 23.6: Vortrag

Dienstag, 9. März 2004, 18:00–18:15, H13

Infrared ellipsometry characterization of organic conducting thin films — •M. Schubert¹, C. Bundesmann¹, G. Jakopic², A. Haase², H. Arwin³, N. C. Persson³, F. Zhang³, and O. Inganäs³ — ¹Fakultät für Physik und Geowissenschaften, Instititut für Experimentelle Physik II, Universität Leipzig, Linnéstraße 5, 04103 Leipzig — ²JOANNEUM Research Forschungsgesellschaft mbH, Steyrergasse 17, A-8010 Graz, Austria — ³Department of Physics and Measurement Technology, Linköping University, SE-581 83 Linköping, Sweden

Infrared spectroscopic ellipsometry (IRSE) for wave numbers from 333 to 4000 cm⁻¹ is demonstrated as useful technique for characterization of structural, vibrational, and free-charge-carrier properties of conducting organic thin layers deposited on electrically conducting as well as on isolating substrates. Pentacene, poly(3,4-ethylenedioxy thiophene)/poly(styrenesulfonate) (PEDOT:PSS), C60 and polyfluorene are studied exemplarily. For all materials the infrared dielectric functions are reported, which can serve as fingerprints for multiple-layer structures analysis. PEDOT:PSS layers deposited onto n-type and p-type silicon substrates reveal different conductivity response, indicative for charge transfer at the semiconductor/polymer interface, whereas the IRSE data show that the pentacene layers on glass are rendered highly resistive.