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O: Oberflächenphysik

O 14: Postersitzung (Adsorption an Oberflächen, Epitaxie und Wachstum, Organische Dünnschichten, Oxide und Isolatoren, Phasenübergänge, Rastersondentechniken, Struktur und Dynamik reiner Oberflächen)

O 14.83: Poster

Montag, 8. März 2004, 18:00–21:00, Bereich C

Cantilever characterization by noise measurements in an Atomic Force Microscope — •T.D. Long, F. Müller, A.-D. Müller, and M. Hietschold — Chemnitz University of Technology, Institute of Physics, Solid Surface Analysis Group, 09107 Chemnitz

This contribution presents an instrumentation for low signal analysis based on the lock-in amplifier principle. The device has been developed for enhanced signal analysis of multiple cantilever devices for the Atomic Force Microscopy, where the individual elongations of the cantilevers are separated by frequency selection. Here, its application is demonstrated at the example of cantilever noise measurements. Resonance spectra are detected for various cantilever types in dependence on the excitation amplitude and the pressure. The quality factor is derived and its dependency on several parameters is presented.