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O: Oberflächenphysik

O 23: Rastersondentechniken II

O 23.4: Vortrag

Dienstag, 9. März 2004, 16:30–16:45, H36

Scattering-type near-field microscopy for optical nanoanalytics — •Rainer Hillenbrand — Nano-Photonics Group, Max-Planck Institut für Biochemie, 82152 Martinsried

We present a scattering-type scanning near-field optical microscope (s-SNOM) that allows optical imaging at 10nm spatial resolution [1] independent of the wavelength. In our s-SNOMs the tip apex of an atomic force microscope (AFM) is illuminated either by a HeNe laser at 633nm or a CO2 laser at about 10um wavelength. Interferometric detection [2] of the scattered light allows us to visualize the optical eigenfield patterns of 91 diameter, plasmon resonant nanoparticles at 633nm wavelength [3]. When operating the microscope at mid-infrared frequencies we find a strongly resonant near-field coupling between tip and a SiC sample due to local excitation of phonon polaritons in SiC [4]. Such phonon-enhanced near-field interaction is not only sensitive to the local chemical composition but also to the local crystal structure of the surface and thus allows besides chemical imaging also mapping of crystal quality at nanoscale resolution. Altogether, we envisage optical nanospectroscopy and imaging of physical, chemical and biological nanocomposites.

[1] R. Hillenbrand, F. Keilmann, Appl. Phys. Lett. 80, 25 (2002)

[2] R. Hillenbrand, F. Keilmann, Phys. Rev. Lett. 85, 3029 (2000)

[3] R. Hillenbrand et.al., Appl. Phys. Lett. 83, 368 (2003)

[4] R. Hillenbrand, T. Taubner, F. Keilmann, Nature 418, 159 (2002)