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O: Oberflächenphysik
O 28: Postersitzung (Elektronische Struktur, Grenzfläche fest-flüssig, Halbleiteroberflächen und -grenzflächen, Magnetismus und Symposium SYXM, Methodisches, Nanostrukturen, Oberflächenreaktionen, Teilchen und Cluster, Zeitaufgelöste Spektroskopie)
O 28.12: Poster
Mittwoch, 10. März 2004, 16:00–19:00, Bereich C
Site-specific Valence-electronic Structure of SrTiO3 by X-ray Standing Waves and XPS — •Sebastian Thiess1, Tien-Lin Lee1, Bruce C. C. Cowie1, Joe C. Woicik2, and Jörg Zegenhagen1 — 1ESRF, Grenoble, France — 2NIST, Gaithersburg, USA
We used the x-ray standing waves (XSW) technique and x-ray photoelectron spectroscopy (XPS) to determine the contribution of the constituent elements Sr, Ti and O of a SrTiO3 (STO) crystal to the STO valence band, thus deriving their partial density of states.
Lattice site-specific electronic information - which is not available from standard XPS - is obtained by utilising the spatial intensity modulation of an x-ray standing wave (XSW) interference field, generated by the coherent superposition of an incident and a Bragg-reflected x-ray beam. By proper positioning the antinodes of the XSW within the STO unit cell, photoemission from specific lattice sites can be preferentially excited and their valence electronic contribution identified.
XSW fields were generated by the STO(111) and STO(112) reflections at photon energies of 2.7 and 3.9 keV. XSW modulated, high-resolution core and valence-electron emission spectra were recorded from an in-situ UHV annealed STO single crystal at beamline ID32 at the ESRF.