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O: Oberflächenphysik
O 28: Postersitzung (Elektronische Struktur, Grenzfläche fest-flüssig, Halbleiteroberflächen und -grenzflächen, Magnetismus und Symposium SYXM, Methodisches, Nanostrukturen, Oberflächenreaktionen, Teilchen und Cluster, Zeitaufgelöste Spektroskopie)
O 28.33: Poster
Mittwoch, 10. März 2004, 16:00–19:00, Bereich C
Focussing XUV photons with high contrast — •J. Buck1, M. Kalläne1, S. Harm1, M. Skibowski1, R. L. Johnson2, and L. Kipp1 — 1Institut für Experimentelle und Angewandte Physik, Universität Kiel, D-24098 Kiel, Germany — 2Institut für Experimentalphysik, Universität Hamburg, D-22761 Hamburg, Germany
Photon sieves consisting of a large number of pinholes appropriately distributed over the Fresnel zones focus electromagnetic radiation [1]. As part of the program to develop photon sieves for VUV FEL radiation [2] we present first experimental results on the focussing properties of reflective photon sieves, which allow to enhance the image contrast efficiently. The experiments have been performed with visible light (hν = 1.96 eV) and XUV radiation (hν = 100 eV) supplied from the BW3 beamline at HASYLAB.
[1] L. Kipp, M. Skibowski, R.L. Johnson, R. Berndt, R. Adelung, S. Harm and R. Seemann, Nature 414, 184 (2001)
[2] A free-elecron laser (FEL) delivering transversal coherent radiation in the vacuum ultraviolet regime with photon energies up to several 100 eV is currently under construction at the Hamburg Synchrotron Radiation Laboratory HASYLAB/DESY. Work supported by the BMBF proj. 05 KS1 FK1