Regensburg 2004 – wissenschaftliches Programm

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O: Oberflächenphysik

O 28: Postersitzung (Elektronische Struktur, Grenzfläche fest-flüssig, Halbleiteroberflächen und -grenzflächen, Magnetismus und Symposium SYXM, Methodisches, Nanostrukturen, Oberflächenreaktionen, Teilchen und Cluster, Zeitaufgelöste Spektroskopie)

O 28.39: Poster

Mittwoch, 10. März 2004, 16:00–19:00, Bereich C

Dynamic Mode Force Microscopy Studies of Individual Single Wall Nanotubes on HOPG — •Timo Behnke¹, Makoto Ashino¹, Alexander Schwarz¹, Roland Wiesendanger¹, Keith A. Williams², and Cees Dekker² — ¹Institute of Applied Physics, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany — ²Department of Applied Physics and DIMES, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands

The growing interest in single wall carbon nanotubes (SWNT) is related to their prospected applications of their unique possibilities in upcoming nanotechnology (1). To study structural properties of SWNTs down to the atomic scale dynamic mode force microscopy is well suited.

In a first step, we developed a technique to prepare SWNTs on HOPG. Tapping Mode Imaging in ambient conditions showed a homogeneous SWNT distribution on atomically flat and well defined graphite (HOPG) with only negligible small amounts of contamination. Although most of SWNTs appeared as bundles or ropes, we found a sufficient density of individual SWNTs. In a second step, we took advantage of the increased resolution of dynamic mode force microscopy and spectroscopy in ultrahigh vacuum and used a home-built low noise and very stable low-temperature force microscope to resolve the atomic structure of individual tubes.

[1] Baughman, Zakhidov, de Heer, Science 296, 787 (2002)