Regensburg 2004 – scientific programme

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O: Oberflächenphysik

O 28: Postersitzung (Elektronische Struktur, Grenzfläche fest-flüssig, Halbleiteroberflächen und -grenzflächen, Magnetismus und Symposium SYXM, Methodisches, Nanostrukturen, Oberflächenreaktionen, Teilchen und Cluster, Zeitaufgelöste Spektroskopie)

O 28.51: Poster

Wednesday, March 10, 2004, 16:00–19:00, Bereich C

Application of imaging XPS for chemical analysis and mapping of magnetic domains — •S. Schmidt¹, M. Escher², F. Forster¹, D. Funnemann³, B. Krömker³, M. Merkel², F. Reinert¹, and N. Weber² — ¹Universität des Saarlandes, FR 7.2 Experimentalphysik, Postfach 151150, 66041 Saarbrücken — ²Focus GmbH — ³Omicron Nanotechnology GmbH

We present first scientific applications of a new NanoESCA [1] spectrometer: we have used the good spatial resolution to investigate the chemical structure of plain and decorated grain boundaries in two reference materials Al_0.98Sn_0.02 and Cu_0.98Bi_0.02 [2]. The data measured at the high-intensity small-spot beamlines of BESSY II also exhibit detailed information about the oxidation processes in such materials. In Al_0.98Sn_0.02 we have detected small differences in the binding energy of the Al 2p XPS peak of 30–50 meV that could be related to different grain orientations. We also present data taken on the nanowire prototype system Cu/ZnSe₂ [3] where the Cu-nanowires are effectively protected against oxidation even during air-exposure. Using cicular polarization at the undulator we were able to map magnetic domains [4] in a Fe single crystal at the Fe 2p XPS core-level with high contrast.

[1] D. Funnemann et al., Bessy Annual Report, 2002

[2] S. Schmidt et al., Bessy Annual Report, 2002

[3] R. Adelung et. al, Adv. Mater. 14, 15, p. 1056-1061, 2002

[4] C. Schneider et al., Rep. Prog. Phys, 65, R1785-R1839, 2002