Regensburg 2004 – wissenschaftliches Programm
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O: Oberflächenphysik
O 28: Postersitzung (Elektronische Struktur, Grenzfläche fest-flüssig, Halbleiteroberflächen und -grenzflächen, Magnetismus und Symposium SYXM, Methodisches, Nanostrukturen, Oberflächenreaktionen, Teilchen und Cluster, Zeitaufgelöste Spektroskopie)
O 28.58: Poster
Mittwoch, 10. März 2004, 16:00–19:00, Bereich C
Spectral evidence for oxide free incorporation of oxygen into Ru(0001) — •Raoul Blume1, Artur Böttcher2, Horst Conrad3, and Horst Niehus1 — 1Institut für Physik, HU-Berlin, Newtonstr. 15, 12489 Berlin — 2Institut für Physikalische Chemie, Universität Karlsruhe, Kaiserstr. 12, 76131 Karlsruhe — 3Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, 14195 Berlin
The capability of a smooth and defected Ru(0001) surface towards the oxygen accumulation has been studied by the means of thermal desorption spectroscopy (TDS) and the high resolution scanning XPS (Elettra, Trieste). By applying a soft Ar+-sputtering procedure individual surface defects confined to the two outermost Ru layers were created. The oxidation procedure applied here assures an incorporation of oxygen atoms in the subsurface region up to 4 monolayer equivalents (MLE) without any traces of RuO2-domains (high-pressure and low-temperature surface oxidation). By measuring the temperature and exposure dependence of the oxygen incorporation and analyzing the corresponding evolution of the Ru 3d5/2 band we found characteristic electronic signatures allowing to distinguish oxygen atoms occupying the Ru(I)-Ru(II) interlayer space and oxygen species associated with surface defects. This assignment is supported by mesoscopic-scale surface images as well as the quantitative O2-TD analysis.