Regensburg 2004 – scientific programme

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O: Oberflächenphysik

O 9: Rastersondentechniken I

O 9.1: Talk

Monday, March 8, 2004, 15:45–16:00, H36

Three-dimensional force fields of single wall carbon nanotubes by scanning dynamic force spectroscopy — •Makoto Ashino¹, Timo Behnke¹, Alexander Schwarz¹, Keith A. Williams², Cees Dekker² und Roland Wiesendanger¹ — ¹Institute of Applied Physics, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany — ²Department of Applied Physics and DIMES, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands

We measured three-dimensional (3D) force fields above single wall carbon nanotubes (SWNTs) in ultra-high vacuum by scanning dynamic force microscopy and spectroscopy at low temperature (< 12 K). The 3D force field measurement was based on the systematic recording of the frequency shift of the cantilever oscillation, caused by the tip−sample interaction [1]. The atomic-resolution carbon lattice images were obtained in noncontact mode observation before and after the 3D force field measurement. The image contrast of the carbon lattice in SWNTs was different from that in the graphite (HOPG). We analyzed the spatial distribution of the force between tip and surfaces of individual SWNTs and a SWNT bundle in terms of long- and short-range contribution to the tip-sample interaction. On the basis of this analysis, we will discuss the adsorption sites of other molecules on to the surfaces of individual SWNTs and SWNT bundles.

[1] H. Hölscher et al., Appl. Phys. Lett. 81, 4428 (2002).