Regensburg 2004 – scientific programme
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SYOH: Organic and Hybrid Systems for Future Electronics
SYOH 5: Poster
SYOH 5.28: Poster
Thursday, March 11, 2004, 18:00–21:00, B
Determination of the Anisotropic Optical Properties for Perfluorinated Vanadyl Phthalocyanine Thin Films — •O. D. Gordan1, M. Friedrich1, W. Michaelis2, R. Kr öger3, T. Kampen1, D. Schlettwein2, and D. R. T. Zahn1 — 1Institute of Physics, University of Technology Chemnitz, — 2Physical Chemistry 1, Institute of Pure and Applied Chemistry, — 3Institute of Solid State Physics, University of Bremen, D-28334
Thin films of perfluorinated vanadyl phthalocyanine F16PcVO were prepared by physical vapor deposition (PVD) in high vacuum on fused silica and KBr substrates. The absorption spectra in the visible region show that the films on different substrates have different structure. The optical constants for F16PcVO films were obtained in the spectral range of 0.7 - 4.5 eV from the simulation of ellipsometry spectra with an anisotropic uniaxial model. From the difference between the in-plane and out-of-plane components of the dielectric function the average tilt angle of the F16PcVO molecular planes with respect to the substrate plane was found to be 560 for fused silica substrates and between 00 and 30 for KBr substrates.