Regensburg 2004 – scientific programme
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SYXM: X-RAY Magneto-Optics
SYXM 1: X-Ray Magneto-Optics
SYXM 1.4: Invited Talk
Tuesday, March 9, 2004, 16:00–16:30, H1
Resonant soft x-ray diffuse scattering from magnetic multilayers — •Maurizio Sacchi1, Carlo Spezzani1, Renaud Delaunay2, and Coryn F. Hague1,2 — 1LURE, Centre Universitaire Paris Sud, Orsay, France — 2LCP–MR, Université P. et M. Curie, Paris, France
We have applied resonant diffuse scattering of polarized soft x-rays to the investigation of the field dependent magnetic structure in Co/Cu multilayers. At remanence, and for weak applied fields, Co layers break up into magnetic domains with a high degree of AF coupling normal to the stacked layers. We estimate the degree of AF coupling and the average size of the AF domains as a function of the applied field.
The analysis of the domain size distribution, and of its correlation with magnetoresistance, after a demagnetization process gives further evidence that the remanent magnetic structure is influenced by the magnetic history of the multilayer.
We have compared the field dependence of the sample resistance and of the scattered intensity at various off-specular angles. Our results suggest that at high fields non-negligible variations in the resistance may be due to the persistence of small magnetically hard domains.