Berlin 2005 – scientific programme

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A: Atomphysik

A 13: Poster HU 2

A 13.36: Poster

Tuesday, March 8, 2005, 08:30–18:30, Poster HU

Absolute ionization cross sections of rare gases as background for VUV photon diagnostics — •A.A. Sorokin^1,2, I.L. Beigman³, S.V. Bobashev², A. Gottwald¹, M. Richter¹, K. Tiedtke⁴, and L.A. Vainshtein³ — ¹Physikalisch-Technische Bundesanstalt, PTB, Abbestr. 2-12, 10587 Berlin, Germany — ²A. F. Ioffe Physico-Technical Institute RAS, Politekhnicheskay 26, 194021 St.Petersburg, Russia — ³P. N. Lebedev Physical Institute RAS, Leninsky prosp. 53, 117924 Moscow, Russia — ⁴Deutsches Elektronen-Synchrotron, DESY, Notkestr. 85, 22603 Hamburg, Germany

By accurate measurements of total cross section ratios for photoionization (PI) and electron-impact ionization (EI), we recently determined total EI and PI cross sections of rare gas atoms (He, Ne, Ar, Kr, Xe) with relative standard uncertainties below 3 [1]. The data represent an accurate and reliable cross-section database needed for testing theoretical models, modeling fusion plasmas, and realizing photon metrology for new powerful VUV and EUV radiation sources. Here, we compare our experimental data with calculations and present an example of their utilization for a quantitative characterization of the highly intense and strongly pulse VUV free- electron-laser radiation at the TESLA test facility in Hamburg realized by a recently developed gas-monitor detector, which is based on atomic photoionization of rare gases at low particle density [2].

[1] A.A. Sorokin et al, J. Phys. B 37 (2004) 3215 [2] M. Richter et al, Appl. Phys. Lett 83 (2003) 2970