Berlin 2005 – wissenschaftliches Programm
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A: Atomphysik
A 8: Poster HU 1
A 8.19: Poster
Samstag, 5. März 2005, 08:30–18:30, Poster HU
Extreme Ultraviolet (EUV) Emission Lines of Highly Charged Xenon Ions — •R. Radtke1, C. Biedermann1, G. Fußmann1, J.L. Schwob2 und P. Mandelbaum2 — 1Institut für Physik der Humboldt-Universität zu Berlin, Lehrstuhl Plasmaphysik, Newtonstraße 15, 12489 Berlin und Max-Planck-Institut für Plasmaphysik, Bereich Plasmadiagnostik, EURATOM Association, Germany — 2Racah Institute of Physics, The Hebrew University, 91904 Jerusalem, Israel
As part of our program to generate accurate atomic physics data in support of the fusion work, the Berlin electron beam ion trap (EBIT) has been used to measure the line radiation from highly charged xenon ions. Xenon has recently been proposed as a coolant for the plasma edge region of future large tokamaks, such as the International Thermonuclear Experimental Reactor (ITER). In order to estimate the radiated power, knowledge of the transitions giving rise to line emission is an essential issue. EBIT has the capability to select a particular, narrow ionization balance and, in conjunction with our grazing incidence spectrometer, allows measuremens of the EUV emission lines over a wide range of charge states. We have performed scans of the line radiation for ions with charge state 11+ (Te-like xenon) to 51+ (Li-like xenon) in the 50-800-Å range. Very distinct lines or groups of lines could be identified for individual ion charge states. We also compare our measurements with teoretical calculations using the multiconfiguration relativistic HULLAC computer code. For some transition wavelengths large deviations between the measured and predicted values are noted.