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CPP: Chemische Physik und Polymerphysik

CPP 14: Polymer physics at the surface

CPP 14.4: Vortrag

Montag, 7. März 2005, 17:15–17:30, TU C130

Modification and imaging of surface charges on polymers using atomic force microscopy — •Andreas Kleiner¹, Sabine Hild¹, Othmar Marti¹, Armin Knoll², Bernd Gotsmann², Urs Dürig², and Johannes Windeln² — ¹Dept. of Experimental Physics, University of Ulm, 89069 Ulm — ²IBM Research GmbH, Zurich Research Laboratory, CH-8803 Rüschlikon

The atomic force microscope (AFM) is widely used to investigate and modify mechanical properties of thin polymer films. Different static and dynamic modes like force curve measurements, Pulsed Force Mode or intermittent contact techniques apply certain amounts of normal and lateral forces to the sample. This implies the possibility to create surface charges, similar to the macroscopic contact electrification of insulators. These charges can be imaged in the ’Surface Potential’ or ’Kelvin Probe Force’ mode of the AFM. The quantity of charge depends on parameters like contact time, force or velocity. By an additional tip voltage during contact, the amount and polarity of the surface charges can be influenced. The long-term stability of these charges, measured on different polymers, will be also shown in this work.