Berlin 2005 – scientific programme

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CPP: Chemische Physik und Polymerphysik

CPP 15: Special techniques

CPP 15.3: Talk

Monday, March 7, 2005, 17:00–17:15, TU C230

Noncontact atomic force microscopy under ambient conditions using tuning fork sensors — •S. Strömsdörfer, V. Dremov, and P. Müller — Physikalisches Institut III, Universität Erlangen-Nürnberg

We describe the operation of an atomic force microscope based on a 32 kHz quartz tuning fork sensor under ambient conditions. As additional masses change the quality factor Q of the sensor, it is desirable to have tips as small as possible. We present a reliable technique of lightweight tip preparation. We grow both hydrophobic amorphous carbon tips and ultra-sharp metallic tips as well as single-wall carbon nanotube bundles. In all cases, besides frequency shifts of approximately 10 Hz, the decrease of Q is only a few percent.

In non-contact AFM mode, a rather wide range of samples is accessible for investigations. In particular, objects with weak adhesion to the substrate and soft materials have been investigated. We demonstrate the ability of our technique to observe the existence of liquid adsorbates.