Berlin 2005 – scientific programme
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CPP: Chemische Physik und Polymerphysik
CPP 30: POSTER: Chemical physics
CPP 30.16: Poster
Tuesday, March 8, 2005, 16:30–18:30, Poster TU D
SFM as a Model System for Local Impact — •Alexander Gigler1, Sabine Hild1, Stefan Walheim2, Othmar Marti1, and Thomas Schimmel2 — 1Experimental Physics, University of Ulm, D-89069 Ulm — 2Institute for Nanotechnology, Forschungszentrum-Karlsruhe GmbH, D-76021 Karlsruhe
For surface characterization using Scanning Force Microscopy (SFM) the understanding of tip-sample interactions is a crucial point. Normal and lateral forces act during such experiments and have to be investigated at the same time to find out the correlations between them. To model these forces a method called Dynamic Friction Force Microscopy (DFFM) has been added to an existing Digital Pulsed Force Mode (DPFM). The crash of a head of a hard-disk into the disk is an example for such an impact. Since this event happens at high speeds (meters per second), the setup has been extended to this range of relative tip-sample velocity.