Berlin 2005 – scientific programme

Parts | Days | Selection | Search | Downloads | Help

CPP: Chemische Physik und Polymerphysik

CPP 30: POSTER: Chemical physics

CPP 30.20: Poster

Tuesday, March 8, 2005, 16:30–18:30, Poster TU D

Combined IR and VIS ellipsometric study of polymer films — •Karsten Hinrichs¹, Michael Gensch¹, Norbert Esser¹, Karin Sahre², Jürgen Pionteck², and Klaus-Jochen Eichhorn² — ¹ISAS - Institute for Analytical Sciences, Department Berlin, Albert-Einstein-Str. 9, 12489 Berlin, Germany — ²Leibniz Institute of Polymer Research Dresden, Hohe Str. 6, D-01069 Dresden, Germany

Ellipsometry in the mid infrared (MIR) [1] and Visible (VIS) spectral range have been cooperatively applied for the measurement of optical constants of various polymer films: e.g polyimides, poly(n-butyl methacrylate) and poly(vinyl chloride) layers on gold and silicon substrates. Such optical constants are important e.g. for studies with mixed systems or as input parameters for other methods, such as scanning near field microscopy or attenuated total reflection spectroscopy. Simulation and interpretation of the ellipsometric spectra in optical layer models allowed the determination of the thickness, the high frequency refractive index and the parameters of molecular vibrations of the different polymer compounds. The optical constants of the single compounds served as input data for the analysis of miscibility, composition and structure in thin films [2,3]. [1] K. Hinrichs, D. Tsankov, E.H Korte, A. Röseler, K. Sahre, K.-J. Eichhorn, Appl. Spectrosc. 56 (2002) 737. [2] G. Dlubek, G. Pompe, J. Pionteck, A. Janke, D. Kilburn, Macromol. Chem. Phys. 204 (2003) 1234. [3] N.A. Nikonenko, K. Hinrichs, E.H. Korte, J. Pionteck, K.-J. Eichhorn, Macromolecules 37 (2004) 8661.