Berlin 2005 – scientific programme

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CPP: Chemische Physik und Polymerphysik

CPP 9: SYMPOSIUM: Polymer networks and beyond: From molecular structure to materials and biological functions POSTER

CPP 9.21: Poster

Saturday, March 5, 2005, 16:45–18:45, Poster TU D

Surface morphology of pressure sensitive adhesive blend films as probed by atomic force microscopy — •K.M. Schlögl, E. Maurer, S. Loi, and P. Müller-Buschbaum — TU München, Physik-Department E13, James-Franck-Str. 1, D-85747 Garching, Germany

Pressure sensitive adhesives (PSA) play an important role as materials in the glue industry as well as in everyday life. Beside of homo- and copolymers polymer mixtures are of great interest due to their ability to increase the stickiness of the surface. The adhesion properties are depending decisive on the bonding history, which means parameters like contact pressure and time, temperature and debonding rate. One central aspect in understanding the adhesion process lies therefore in characteristics and conditions of the examined surface. The atomic force microscope (AFM) is a widespread spectroscopic method for surface analysis. Information about the structure and composition of these polymer blends are obtained down to the molecular scale. In this way characteristic illustrations of the roughness and surface morphology can tend to control the adhesive process.