DS 18: Optische Spektroskopie dünner Schichten I
Montag, 7. März 2005, 15:15–16:45, TU HS110
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15:15 |
DS 18.1 |
Infrared ellipsometric study of electrochemically grafted organic layers on TiO2 and Si — •Katy Roodenko, Michael Gensch, Jörg Rappich, Ullrich Schade, Ralf Hunger, Thomas Dittrich, Alexandra Merson, Yoram Shapira, Norbert Esser, and Karsten Hinrichs
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15:30 |
DS 18.2 |
Ultra-violet ellipsometry of ultra thin organic layers — •Ovidiu D. Gordan, C. Himcinschi, M. Friedrich, C. Cobet, N. Esser, W. Braun, and D. R. T. Zahn
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15:45 |
DS 18.3 |
The crucial role of surface roughness in SEIRA and SERS — •Annemarie Pucci, Andreas Priebe, Matthias Lust, Gerhard Fahsold, and Andreas Otto
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16:00 |
DS 18.4 |
Raman investigations of metal contacts on organic thin films: reactivity, indiffusion, and metal morphology — •G. Salvan, B. A. Paez, L. Mancera, R. Scholz, and D.R.T. Zahn
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16:15 |
DS 18.5 |
Raman spectroscopy of embedded semiconductor monolayers: CdSe in BeTe and ZnSe — •U. Bass, S. Mahapatra, T. Muck, V. Wagner, K. Brunner, and J. Geurts
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16:30 |
DS 18.6 |
In-situ Untersuchungen von Wachstumsparametereinflüssen auf die MOVPE von GaN — •H. Hardtdegen, R. Steins, N. Kaluza, Z. Sofer, Y.S. Cho, M. Zorn, K. Haberland und J.-T. Zettler
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