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DS: Dünne Schichten
DS 21: FV-internes Symposium „Optische Spektroskopie von dünnen Schichten und Grenzfl
ächen"
Dienstag, 8. März 2005, 09:45–13:30, TU HS110
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09:45 | DS 21.1 | Hauptvortrag: Real-time optical diagnostics for epitaxial growth — •D. E. Aspnes |
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10:30 | DS 21.2 | Hauptvortrag: Ab-initio calculations of electronic and optical properties of surfaces — •Olivia Pulci |
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11:15 | DS 21.3 | Hauptvortrag: Optical analysis of monolayers at surfaces and interfaces — •V. Wagner |
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12:00 | DS 21.4 | Hauptvortrag: Biomolecular layers on silicon studied by optical spectroscopy — •Dietrich R.T. Zahn |
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12:45 | DS 21.5 | Hauptvortrag: Infrared ellipsometry for structure analysis of organic films — •Karsten Hinrichs, Michael Gensch, Katy Roodenko, and Norbert Esser |