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DS: Dünne Schichten

DS 23: Postersitzung I

DS 23.36: Poster

Freitag, 4. März 2005, 16:00–18:30, Poster TU B

X-ray interferometers for measuring spatial coherence and optical constants — •Wolfram Leitenberger, Ullrich Pietsch, and Tobias Panzner — Universität Potsdam, Am Neuen Palais 10, 14468 Potsdam, Germany

We have investigated the spatial coherence properties of X-rays in a large spectral range between 5 and 20 keV using different types of X-ray interferometers all known from classical optics (double pinhole interferometer and Fresnel bi-mirror). The experiments were done with a white X-ray beam of a bending magnet at BESSY synchrotron. For energy discrimination was used an energy dispersive solid state detector. The spatial resolution of a few micron was achieved by small pinhole apertures in front of the detector. From the measured high contrast interference fringes we could calculate the degree of spatial coherence and values of the index of refraction in the whole spectral range.