Berlin 2005 – wissenschaftliches Programm

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DS: Dünne Schichten

DS 23: Postersitzung I

DS 23.40: Poster

Freitag, 4. März 2005, 16:00–18:30, Poster TU B

Investigation of molecular thin films using TEM and electron diffraction — •Benjamin Graffel¹, Steffen Schulze¹, Oksana Dmytrenko², Ralph-Peter Krüger³, and Michael Hietschold¹ — ¹Solid Surfaces Analysis Group, Institute of Physics, Chemnitz University of Technology, Germany — ²Departments of Physics Shevchenko Kyev University, Ukraine — ³BAM Berlin, Germany

We studied the crystalline structure of films from ball-shaped molecules using electron diffraction. We used both fullerenes and siloxane molecules for our experiments. The films were prepared by thermal vacuum evaporation of the material under high-vacuum conditions. The films have been found to be either of fine-crystalline structure with some crystallites reaching a size of up to 100 nm or of amorphous structure. The sublimation temperature was equal to 730 K in the case of fullerenes and about 570 K in the case of siloxanes. The crystallographic analysis from electron diffraction patterns suggested the dense packed structure of the fullerite C60-balls occurring in a stacking of hcp and fcc close packed planes parallel to the substrate surface. Furthermore the electron diffraction patterns provide us with intra-molecular structure data of the individual C60 and siloxane balls and can be understood in terms of the structure model of such balls.