Berlin 2005 – wissenschaftliches Programm

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M: Metallphysik

M 32: Poster TU B (Symposium Tomographic Methods in Materials Research M-32.32-55)

M 32.1: Poster

Montag, 7. März 2005, 14:30–16:30, Poster TU B

Surface morphology changes of 20 - 120 nm thin epitaxial Nb-films during hydrogen uptake — •Kai Nörthemann, Reiner Kirchheim, and Astrid Pundt — Institut für Materialphsysik, Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen

The arrangement of phases in thin epitaxial films is presented in this contribution, using the model system Niobium-Hydrogen.

Because of the different lattice parameter of Niobium and Niobium hydride it is possible to study with the surface sensitive scanning tunneling microscopy (STM) the lateral arrangement of the α-phase and the hydride. STM pictures of thin epitaxial niobium films were taken during hydrogen loading, therefore the time dependency of the hydride formation can be examined. Different types of hydride arrangements were found. Their appearance will be discussed with regard to film thickness and roughness as well as substrate parameters. The stability of the arrangements will also be discussed.

This work is financially supported by the DFG via SFB 602.