Berlin 2005 – scientific programme
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M: Metallphysik
M 32: Poster TU B (Symposium Tomographic Methods in Materials Research M-32.32-55)
M 32.25: Poster
Monday, March 7, 2005, 14:30–16:30, Poster TU B
Thermo-physical properties of thin film and FIB modified NiTi shape memory alloys — •Jürgen Gibkes1, Ch. Zamponie2, R. Wernhardt3, B.K. Bein1, and J. Pelzl1 — 1Solid State Spectroscopy, Experimantal Physics 3, Ruhr-University, D-44780 Bochum — 2Cesar Research Center, D-53175 Bonn — 3Experimental Physics 6, Ruhr-University, D-44780 Bochum
Thermal transport parameters are key parameters for the functionality of shape memory (SM) material. The need of miniaturisation of the SM devices requires alternative preparation techniques of the base material affecting the thermal transport parameter. We have investigated films of a few microns thickness and bulk samples laterally surface modified by FIB (focus ion beam). The NiTi films were prepared by sputtering. After removing the amorphous films from the substrate they are thermal treated in order to induce a crystalline structure. The thermal transport properties were investigated by frequency dependent photothermal infrared radiometry. The annealed films exhibit different thermal parameters as the bulk materials of the same composition. The FIP prepared samples were investigated with a scanning thermal microscope (SThM). Local changes of the thermal transport properties with different doses were measured with a resolution of about 50 nm.
This work was performed in the frame of the Sonderforschungsbereich 459.