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M: Metallphysik
M 32: Poster TU B (Symposium Tomographic Methods in Materials Research M-32.32-55)
M 32.37: Poster
Montag, 7. März 2005, 14:30–16:30, Poster TU B
Nonlinear registration of series of atomic force microscopy images of nanostructured materials — •Sabine Scherdel1, Stefan Wirtz2, Nicolaus Rehse1 und Robert Magerle1 — 1Physikalische Chemie II, Universität Bayreuth, 95440 Bayreuth — 2Mathematisches Institut, Universität zu Lübeck, 23560 Lübeck
Nanotomography is a new method to map the complex spatial structure of modern materials. Here a series of two-dimensional atomic force microscopy images is obtained. To reassemble these to a volume image image distortions must be corrected. We have modified a more general registration method [1] for our applications, which was mainly applied to medical science so far. Our atomic force microscopy images are cutouts of an object and show not a single object that is clearly separated from the background. Furthermore the selected section is slightly shifted in each image. Inevitable contaminations of the specimen are another problem. They appear in just one layer and contribute with high grey values to the calculation of the distortion field, even though they comprise no three-dimensional image info
rmation at all. By the use of this nonlinear registration we are able to picture nanostructured materials over large ranges (1
mum) with a resolution of 10 nm per pixel. Examples are a 20 nm wide rack in a nickel based super alloy as well as several crystalline lamellae in a semi-crystalline polymer film.
B. Fischer, J. Modersitzki, J. of Math. Imag. Vision 2003, 18, 81.