Berlin 2005 – wissenschaftliches Programm

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M: Metallphysik

M 32: Poster TU B (Symposium Tomographic Methods in Materials Research M-32.32-55)

M 32.49: Poster

Montag, 7. März 2005, 14:30–16:30, Poster TU B

Flaw Types in Metallic samples Analyzed with Computed Tomography — •Juergen Goebbels, Gerd Weidemann, Heinrich Riesemeier, Bernhard Illerhaus, and Yener Onel — BAM, Unter den Eichen 87, 12205 Berlin

Volume characterization of metallic samples with computed tomography requires a broad spectrum of X-ray energies depending on the maximum material thickness to be penetrated. BAM has developed several tomographs from high resolution computed tomography with synchrotron radiation at the BAMline at BESSY in the energy range from 8 to 80 keV, over laboratory equipment using different kind of microfocus X-ray tubes (a 100 kV transmission type X-ray tube, a conventional 225 kV and a world wide unique 320 kV bi-polar microfocus X-ray tube) up to high energy sources like Co-60 and an 12 MeV electron linear accelerator. The limits of spatial and contrast resolution are discussed together with the types of detectors used. The flaw types ranges from different kind of pores and cracks in welding seams to stress corrosion cracking, inclusions and inhomogenities.