Berlin 2005 – scientific programme

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M: Metallphysik

M 44: Symposium Tomographic Methods in Materials Research

M 44.1: Talk

Tuesday, March 8, 2005, 15:15–15:35, TU H1058

In-situ Synchrotron X-ray Tomography Investigation of Creep Damage — •Anke Rita Pyzalla¹, Bettina Camin², Heinz Kaminski¹, Andreas Kottar¹, Andrea Pernack², Karolina Zimnik¹, Thomas Buslaps³, Marco di Michiel³, Elodie Boller³, and Walter Reimers² — ¹TU Wien, Institute of Material Science and Technology, 1040 Wien, Austria — ²Institute of Material Sciences and Technologies, 10587 Berlin, Germany — ³ESRF, 38043 Grenoble, France

Using a novel miniature creep device the development of creep pores, pore agglomeration and crack growth could be investigated in-situ at high temperature for the first time using synchrotron X-ray tomography. The evolution of the pore volume, pore size and their dependency on temperature and creep stress is presented. The results of the experiments further reveal characteristic differences of the damage evolution for materials containing soft and hard second phase particles.