Berlin 2005 – scientific programme

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MA: Magnetismus

MA 7: Magnetische dünne Schichten II

MA 7.3: Talk

Friday, March 4, 2005, 15:45–16:00, TU H1012

Thickness dependent T-MOKE and XAS study at the 2p edges of ultrathin Co(0001) films on W(110) — •Armin Kleibert¹, Joachim Bansmann¹, Volkmar Senz¹, and Peter Oppeneer² — ¹Universität Rostock, Universitätsplatz 3, 18051 Rostock — ²Department of Physics, Uppsala University, Box 530, S-75121 Uppsala, Sweden

X-ray magnetic resonant scattering (XMRS) is a powerful and element-specific tool for investigations on complex, nanoscaled magnetic samples. In the past these studies involved mainly ex-situ prepared samples or multilayers, where the capping layer has not been taken into account. In this contribution we present recently obtained results on the thickness dependence of the transverse magneto-optical Kerr-effect (T-MOKE) on in-situ prepared atomically smooth ultrathin hcp Co(0001) films on W(110) with thicknesses ranging from several monolayers down to the submonolayer. We observe strong interference effects in the overall reflectivity that are nicely reproduced by magneto-optical calculations. Simultaneously recorded X-ray absorption spectra (XAS) reveal strong changes in the shape of the submonolayer absorption spectra. The corresponding reflectivity is reproduced by simulations based on recalculated optical constants taking into account the reduced atomic density of the submonolayer. Moreover, these Co films possess a strong uniaxial magnetic in-plane anisotropy with the easy axis along the W[110] direction. Thus, one may expect anisotropic orbital magnetic moments which give rise to an anisotropy in the T-MOKE response when rotating the sample around its surface normal. Based on simulations and experimental data we will show the possibility of the observation of such an anisotropy.