Berlin 2005 – scientific programme

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O: Oberflächenphysik

O 15: Postersitzung (Adsorption an Oberfl
ächen, Epitaxie und Wachstum, Organische Dünnschichten, Oxide und Isolatoren, Rastersondentechniken, Zeitaufgelöste Spektroskopie, Methoden)

O 15.39: Poster

Friday, March 4, 2005, 17:00–20:00, Poster TU D

Energy and time resolved coherent x-ray reflectivity from a smooth polymer film — •Gudrun Gleber, Tobias Panzner, and Ullrich Pietsch — Institut für Physik, Universität Potsdam, Am Neuen Palais 10, D-14415 Posdam

Since recent years, x-ray-photon-correlation-spectroscopy is used for the investigation of time depending processes in thin films. Up to now these experiments are performed using single wavelengths.

Recently we have shown that a pink beam provited by the white beam beamline at Bessy II can exploited for coherence experiments [1]. Here we present, for the first time, time resolved reflectivity measurements from thin polymer films using white synchrotron radiation. The advantage of this approach is the fact, that one can measure simultaneous the time correlation at different values of the momentum transfer.

In particular we have investigated the melting of a polymer film on a silicon substrate as a first example for this new kind of measurements. In detail we will show the extracted autocorrelation functions at temperatures below and above the glass temperature of the polymer film.

[1] W. Leitenberger et.al. Physica B 2004