Berlin 2005 – wissenschaftliches Programm

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O: Oberflächenphysik

O 15: Postersitzung (Adsorption an Oberfl
ächen, Epitaxie und Wachstum, Organische Dünnschichten, Oxide und Isolatoren, Rastersondentechniken, Zeitaufgelöste Spektroskopie, Methoden)

O 15.56: Poster

Freitag, 4. März 2005, 17:00–20:00, Poster TU D

Detailed analysis of the response characteristic of a dynamic scanning force microscopy feedback control system — •Frank Ostendorf, Sabine Hirth, and Michael Reichling — Fachbereich Physik, Universität Osnabrück, Barbarastr. 7, 49076 Osnabrück

To obtain high resolution dynamic scanning force microscopy (SFM) images, the understanding and optimisation of the feedback control system is very important. Therefore, we analysed in detail the response characteristic of our electronic circuits. A typical feedback control system for dynamic SFM consist of three independent loops: amplitude control, demodulation control, and distance control. These three loops were analysed by means of a measurement simulation and under realistic imaging conditions. By optimising various components of the feedback control system, we enhance the signal-to-noise-ratio and improve SFM imaging stability.