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O: Oberflächenphysik
O 22: Rastersondentechniken I
O 22.2: Vortrag
Samstag, 5. März 2005, 11:00–11:15, TU EB407
Force-Distance studies by Atomic Force Microscopy using a Double Tuning Fork Sensor at Low Temperature — •Markus Heyde, Maria Kulawik, Hans-Peter Rust, and Hans-Joachim Freund — Fritz-Haber-Institute of the Max-Planck-Society, Faradayweg 4-6, D-14195 Berlin, Germany
A double quartz tuning fork sensor for low temperature ultrahigh vacuum atomic force and scanning tunneling microscopy [1] has been developed. The noise performance of the force sensor as well as the tip preperation is important for optimizing the resolution in the non-contact mode of an atomic force microscope. The features of the new sensor are discussed and compared to previous designs. A set of frequency shift versus distance curves measured at low temperature will be presented. Force and energy versus distance has been calculated from frequency versus distance data [2] . Recent measurements performed on Ag(100) and a thin Al2O3 film on NiAl(110) will be shown.
[1] M. Heyde et al., Rev. Sci. Instrum. 75, 2446 (2004).
[2] J. E. Sader and S. P. Jarvis, Appl. Phys. Lett., 84, 1801 (2004).