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O: Oberflächenphysik
O 22: Rastersondentechniken I
O 22.3: Vortrag
Samstag, 5. März 2005, 11:15–11:30, TU EB407
Thermal atomic force microscopy in vacuum — •Martin Hinz1, Bernd Gotsmann2, Mark A. Lantz2, Urs Dürig2, Johannes Windeln2, and Othmar Marti1 — 1Department of Experimental Physics, University of Ulm, 89069 Ulm, Germany — 2IBM Research GmbH, Säumerstrasse 4, 8803 Rüschlikon,Switzerland
In conventional atomic force microscopy (AFM) studies a sharp tip located on the end of a cantilever beam is used to image the topography of a sample surface. Variations on this technique have also been developed to probe a variety of other surface properties on the nm-scale, such as mechanical, tribological , magnetic and electrical properties. In this study, purpose-designed heatable cantilevers are used to perform heat transfer measurements of point contacts. An AFM is operated at high vacuum (10−6 mbar) where the heat conduction through air is suppressed and the heat flow from the tip to the sample can be measured. The corresponding thermal tip sample contact resistance is measured on different samples such as silicon and thin polymer films. Finally, thermal imaging of a two phase sample system will be presented.