Berlin 2005 – wissenschaftliches Programm

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O: Oberflächenphysik

O 22: Rastersondentechniken I

O 22.6: Vortrag

Samstag, 5. März 2005, 12:00–12:15, TU EB407

Quantitative Measurement of Tip-Sample Forces by Dynamic Force Microscopy in Ambient Conditions — •Hendrik Hölscher¹, Jan-Erik Schmutz¹, Boris Anzcykowski², Marcus Schäfer¹, and Harald Fuchs¹ — ¹Center for NanoTechnology (CeNTech), University of Münster, Gievenbecker Weg 11, 48149 Münster — ²nanoAnalytics GmbH, Gievenbecker Weg 11, 48149 Münster

Dynamic force spectroscopy (DFS) applied in vacuum is a powerful tool to measure conservative as well as dissipative tip-sample interactions with atomic resolution. In contrast to the often applied measurement of force-vs-distance curves measured in contact-mode dynamic force spectroscopy has the advantage that the full range of tip-sample forces can be continuously detected without hysteresis effects caused by the so-called jump-to-contact of the tip towards the sample surface. Despite of the great capabilities of quantitative dynamic force spectroscopy this technique has not been applied in air or liquids up to now. Nonetheless, a recently introduced algorithm [1] now allows the reconstruction of the tip-sample interactions using the so-called constant excitation mode (CE-mode). Since this mode works in air and liquids dynamic force spectroscopy can also be applied in ambient conditions. We present first experimental applications of this approach for different types of samples.

[1] H. Hölscher, B. Gotsmann, A. Schirmeisen, Phys. Rev. B 68, 153401 (2003)