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O: Oberflächenphysik

O 22: Rastersondentechniken I

O 22.8: Vortrag

Samstag, 5. März 2005, 12:30–12:45, TU EB407

FM demodulated Kelvin probe force microscopy for surface photovoltage tracking — •Ulrich Zerweck, Christian Loppacher, Sebastian Teich, Tobias Otto, Elke Beyreuther, Stefan Grafström, and Lukas M. Eng — Institut für Angewandte Photophysik, Technische Universität Dresden, D-01062 Dresden

The surface photovoltage (SPV) of a structured semiconductor surface is deduced via detection of the contact potential difference measured with Kelvin probe force microscopy (KPFM). The experimental setup is based on a quantitative KPFM method complemented with modulated laser illumination in order to measure SPV. In contrast to similar studies based on scanning tunnelling microscopy, KPFM offers the advantage that there is virtually no DC field between tip and sample and, therefore, the SPV is not affected by the presence of the tip.