Berlin 2005 – scientific programme
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O: Oberflächenphysik
O 28: Methodisches (Exp. und Theorie)
O 28.1: Talk
Saturday, March 5, 2005, 15:00–15:15, TU EB407
Coherent x-ray reflectivity using white synchrotron radiation — •Tobias Panzner1, Ivan Vartanyants2, Gudrun Gleber1, and Ullrich Pietsch1 — 1Institut für Physik, Universität Potsdam, Am Neuen Palais 10, D-14415 Posdam — 2HASYLAB at DESY, D- 22603 Hamburg, Germany
In this talk we will present results of x-ray reflectivity measurements with coherent synchrotron radiation. Before application of this method to particular samples one has to analyse precisely the apparatus function of the experimental set-up.
We used a pink beam of 5-20keV and a circular aperture to define the incident wave. Therefore we studied the influence of the diffraction from a circular aperture and the resulting shape of the illumination function approaching the sample. In particular we compare calculated and experimental apparatus function measured at the EDR beamline at BESSY II.
Using this function we show the possibilities and advantages of an energy dispersive set up for static and time resolved coherence experiments and give first results of the investigation of a smooth polymer film covered on silicon.