Berlin 2005 – scientific programme

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O: Oberflächenphysik

O 36: Postersitzung (Elektronische Struktur, Grenzfl
äche fest-flüssig, Halbleiteroberfl
ächen und -grenzfl
ächen, Nanostrukturen, Oberfl
ächenreaktionen, Teilchen und Cluster, Struktur und Dynamik reiner Oberfl
ächen)

O 36.69: Poster

Monday, March 7, 2005, 15:00–18:00, Poster TU F

Highly correlated STM and 2PPE-imaging of defined cluster-substrate System. — •M. Rohmer, C. Wiemann, M. Munzinger, L. Guo, M. Aeschlimann, and M. Bauer — FB Physik,Technische Universität Kaiserslautern, Erwin-Schrödinger-Straße, D-67663 Kaiserslautern

Conventional PE-experiments probe electronic properties of deposited clusters integral over a macroscopic sample area and give, in general, rise to inhomogeneous broadening due to e.g. local substrate inhomogenities or a spread in the cluster properties. To overcome this problem we combined a STM and a PEEM to enable in situ characterization of a surface with respect to topography and lateral distribution of the photoemission yield. The STM allows to set local markers which can be identified in the PEEM images. In this way local highly correlated STM/Photoemission experiments of deposited clusters are possible. We used threshold PE- and 2PPE-PEEM to record the lateral distribution of the photoemission yield from selected areas of Ag clusters on HOPG which had been characterized by STM before. Furthermore, data are presented that correlate local spectroscopic data (in terms of PES and a scan of the laser wavelength) of the Ag/HOPG surface using our PEEM with STM images obtained from identical areas. These results show that the combination of PEEM and STM is an efficient tool for the investigation of nanoscopic systems additional to conventional PES.This work was supported by the DFG, SPP1153.