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O: Oberflächenphysik
O 53: Organische Dünnschichten V
O 53.3: Vortrag
Mittwoch, 9. März 2005, 11:15–11:30, TU EB420
Radiotracer diffusion measurements of noble metal atoms in semiconducting crystalline organic films — •Michael Scharnberg1, Jörn Kanzow1, Klaus Rätzke1, Stefan Meyer2, Jens Pflaum2, Rainer Adelung1, and Franz Faupel1 — 1Lehrstuhl für Materialverbunde, CAU Kiel, Kaiserstr. 2, D-24143 Kiel — 23. Physikalisches Institut, Universität Stuttgart, Paffenwaldring 57, D-70569 Stuttgart
The application of organic field effect transistors (OFETs) for large scale low-cost electronic devices has lead to intense research. Diindenoperylene (DIP) thin films on SiO2 are a prominent system due to their high structural out-of-plane order. Preparation of top contacts might cause diffusion of metal atoms (typically Au or Ag) deep into the organic film changing the injection properties at the interface, which are of great importance for the device performance. Only by understanding the diffusion behaviour of metal in the organic layer, formation of well defined interfaces and control of their properties will become possible. Therefore, diffusion profiles for Ag [1] and Au diffusion in DIP films with different crystalline properties, e.g., Rocking widths, were obtained using a radiotracer technique. The results indicate similarities in the diffusion behaviour of noble metals in polymers and organic crystalline films. They will be discussed with respect to the crystalline structure of the DIP films.
[1] M. Scharnberg et al, APL 2004, in press