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SYOO: Organic Optoelectronics and Photonics
SYOO 6: Poster
SYOO 6.27: Poster
Montag, 7. März 2005, 18:00–20:00, Poster TU A
Surface Stress in Organic Thin Film Growth - Pentacene on Si(111) — •Peter Kury1, Frank Meyer zu Heringdorf1, Kelly Roos2, Kevin Kimberlin2, and Michael Horn-von Hoegen1 — 1Institut für Laser- und Plasmaphysik, Universität Duisburg-Essen, 45141 Essen — 2Bradley University, Peoria (IL), USA
Stress and strain are well established physical quantities
in organical chemistry as well as
in surface physics and have been investigated for decades.
The formation of ordered layers of organic molecules on a crystalline
surface,
however, is a topic that has gained recently enormous interest
and the investigation of the influence of stress on the morphology
is a new challenge [1].
Due to the exclusive van der Waals interactions inside the organic material
only small effects are to be expected during film growth,
although covalent interactions are not unusual at the interface
between the organic molecules at semiconductor surfaces like Si(111) [2].
Here we present high resolution surface stress measurements
by means of surface stress induced optical deflection (SSIOD) on the
molecular layer by layer growth [3] of the high performance organic
semiconductor pentacene on Si(111). We demonstrate how the surface stress
is correlated to the morphology by comparison of SSIOD data
with microscopy (AFM,STM,PEEM).
[1]: M. Gsell et al., Science 280, 717 (1998)
[2]: R. J. Hamers et al., Acc. Chem. Res. 33, 617 (2000)
[3]: F. Meyer zu Heringdorf et al., Nature 412, 517 (2001)