Berlin 2005 – wissenschaftliches Programm
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TT: Tiefe Temperaturen
TT 36: Superconductivity - Vortex Dynamics, Vortex Phases, Pinning
TT 36.2: Vortrag
Mittwoch, 9. März 2005, 10:15–10:30, TU H2053
On the imaging of the flux-line lattice of a type-II superconductor by soft x-ray absorption microscopy — •Manfred Fähnle1, Joachim Albrecht1, Thomas Eimüller1, Peter Fischer1,2, Eberhard Göring1, Daniel Steiauf1, and Gisela Schütz1 — 1Max-Planck-Institut für Metallforschung, Heisenbergstraße 3, 70569 Stuttgart, Germany — 2Center for X-ray Optics, E. O. Lawrence Berkeley National Laboratory, MS-400, 1 Cyclotron Road, Berkeley, CA 94720 U.S.A.
A new method is proposed for the imaging of the flux-line lattice of a type-II superconductor by soft x-ray absorption microscopy. The method is based on the fact that in the core of a flux-line with linear extension 2ξ (ξ= coherence length) the quasiparticle density of states is different from the one of the surrounding superconducting matrix. Like the scanning tunneling microscopy, the x-ray absorption microscopy therefore is sensitive to the spatial variation of the superconducting order parameter which is quite strong across the sample even for fields considerably larger than Hc1, whereas other imaging techniques are sensitive to the spatial variation of the magnetic field which becomes very small for large fields. The new technique has the potential to image in real space static and dynamical properties of the flux-line lattice at arbitrary magnetic fields and with single-flux-line resolution. Based on an estimate of the expected contrast it is shown that the new method is very demanding but probably realizable in the foreseeable future.